Paul F. Fewster: X-Ray Scattering from Semiconductors and Other Materials
Скачать книгу (размер 2 033 Kb , формат fb2, страниц 400) Аннотация: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest…